Phase Noise and Allan Deviation Testers

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Phase Noise and Allan Deviation Testers

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53100A Phase Noise Analyzer – NEW!

53100A DATASHEET

All new phase-noise and ADEV measurement for precision characterization

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5120A Test Set

DATASHEET

Easier, More Accurate and More Cost-Effective Measurements in One Box

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3120A Test Probe

DATASHEET

Accurate phase-noise and ADEV measurement

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Microchip’s digital, state-of-the-art test sets bring a paradigm shift to the way that phase noise and ADEV measurements are made. What was once a complicated and costly procedure has now been made easier, more accurate, and more cost effective. Typically used to characterize high precision oscillators and atomic clocks, Microchip’s test sets are simple one-box solutions that characterize even the lowest noise references more accurately than ever before.